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Industrial Metallurgical Micro >> Industrial Microscopes
MJ6607A Industrial Metallurgical Microscope

MJ6607A industrial microscope is developed and aimed at the semiconductor industry, wafer manufacturing, electronic information industry, metallurgical industry. Used as an advanced microscope, the user can experience its super performance when using it. It can be widely used to identify and analyze Semiconductor, FPD, Circuit encapsulation, circuit substrate, Material, Casting/Metal/Ceramic parts, Precision moulds and observe thicker specimen. High quality and reliable optical system brings much clearer and contrast image. The design meets with the ergonomics needs and makes you feel comfortable and relaxed in doing your job.


Viewing Head

  Compensation Free Trinocular Head, Inclined 30”ć£Ø50mm-75mm£©





  WF10”Į/20mm,crosshair with reticule 0.1mm



  Long working distance Infinite Plan Apochromatic objectives:5



  Quadruple nosepiece with center adjustable



  Double layer mechanical stage


  Stage Size: 190mm”Į140mm


  Moving Range:50mm”Į40mm



  Flashboard type Filters:(green,blue,neutral)



  Coaxial coarse £¦fine focusing adjustment with rack and pinion mechanism.Fine
  focusing scale value 0.002mm


Light Source

  With aperture iris diaphragm and field iris diaphragm,halogen bulb 12V/50W, AC
  85V-230V, brightness adjustable


Polarizing Device

  Analyzer rotatable 360,”ćPolarizer£¦Analyzer can be moved in/out of the optical path


Checking Tool

  0.01mm Micrometer


Optional Accessory

  Two-dimensional measurement software


  Professional metallurgical image analysis software


  Micrometer eyepiece


  1.3Mega”¢2.0 Mega”¢3.0 Mega,5.0 Mega pixels CMOS. Digital camera eyepieces


  Halogen Bulb 12V/100W


  Precision Stage:X-Y moving range 25mm”Į25mm,Moving Precision£¼5um,Digital 
  hand wheel Min.Value:0.1um,360”ćRotatable disc


  Photography attachmentand CCD Adapter 0.5”Į”¢0.57”Į”¢0.75”Į


  Objective: 2”Į


  Planishing tool


  CCD Camera,colour 1/3”åHigh resolution 520 TV lines


Characteristicsand description

1.       Adopt UIS High-resolution, Long working distance, and infinity light path
          correcting system objective imaging technology.
2.       Extending the multiplexing technology of objective, compatible infinity
          objective with all the observation methods.
3.       Aspherical surface Kohler illumination, increasing the viewing brightness.
4.       WF10”Į£Ø¦µ25£©super wide viewing field Eyepiece.

Micrometer Eyepiece is accessory for a variety of optical measuring instruments ,when assembled on an appropriate optical instrument, it can be used for various measurements, such as measuring the holesӊdistance, width and length of the graduation scale and keyways, metal surface quality, spectrum bandwidth, the density of fiber fabric and the field specimens and so on, it can also measure the size of indentation and scratch as accessory of some micro hardness tester.

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